sample desired composition / at%
number
Au Cu Ni Pd Pt
Au_Ni_CuPdPt series
236 0.0 25.0 25.0 25.0 25.0
237 2.5 25.0 22.5 25.0 25.0
238 5.0 25.0 20.0 25.0 25.0
239 15.0 25.0 10.0 25.0 25.0
240 10.0 25.0 15.0 25.0 25.0
241 7.5 25.0 17.5 25.0 25.0
242 20.0 25.0 5.0 25.0 25.0
243 25.0 25.0 0.0 25.0 25.0
Ni_Pt_AuCuPd series
248 25.0 25.0 0.0 25.0 25.0
249 25.0 25.0 5.0 25.0 20.0
250 25.0 25.0 10.0 25.0 15.0
251 25.0 25.0 15.0 25.0 10.0
252 25.0 25.0 20.0 25.0 5.0
253 25.0 25.0 25.0 25.0 0.0
subfolder designations
XRD: X-ray diffraction patterns with 2Theta angle in ° and intensity
SEM: Backscatter electron contrast micrographs
microhardness: Data on several indents to obtain HV0.2, incl. indent position, indent size in µm, magnification, indentation time, etc.
compressiontest: Data on compression tests incl. force and strain or machine-corrected position
APT: Atom probe tomography data according to Cameca standards